EPC provides a range of devices for daisy chain and electromigration testing. A variety of die sizes are currently available. If there is a die size required for your testing that is not currently represented in the table below, please contact us at email@example.com
Electromigration test devices have internal metal layers shorted for electromigration reliability testing.
Daisy chain test devices are suitable for a wide variety of process-related testing, such as life cycle testing, drop testing, thermal testing, and optimizing the assembly process.