Wednesday, September 25, 2019 - Thursday, September 26, 2019
Automotive Lidar 2019
Location: Detroit, Michigan
Automotive Lidar 2019
Join EPC at the upcoming Automotive Lidar 2019 Conference on September 25 – September 26 in Detroit where EPC will showcase eGaN® FETs and ICs for automotive lidar applications.
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Thursday, September 26, 2019 - Friday, September 27, 2019
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
Location: Toulouse, France
The Physics of Failure for the Key Intrinsic Failure Mechanisms in GaN-on-Si Power FETs Speaker: Alex Lidow, Ph.D., CEO and Co-Founder, Efficient Power Conversion
GaN-on-Si technology has been in mass production for 10 years and has gained a reputation for excellent reliability in the field. Behind this record of field reliability is a growing understanding of the physics of failure for commercial and automotive-certified devices. In this talk we will show recent results for hot carrier injection (HCI) and the virtual elimination of dynamic RDS(on), and time dependent dielectric breakdown rates in gate electrodes. Overall these two physical phenomena represent the main intrinsic failure mechanisms and have led to the practical predictions of device performance over long time periods under various high-stress conditions.