This Phase 11 reliability report adds to the growing knowledge base published in the first ten reports [1-10] and covers several key new topics. Gallium nitride (GaN) power devices have been in volume production since March 2010 and have established a remarkable field reliability record. This report will discuss the strategy used to achieve this track record that relied upon tests forcing devise to fail under a variety of conditions to create strong and strong products for the industry.
Alejandro Pozo Ph.D., Shengke Zhang Ph.D., Ricardo Garcia, John Glaser Ph.D., Zhikai Tang Ph.D., and Robert Strittmatter Ph.D, Efficient Power Conversion Corporation
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