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Extreme GaN – What Happens When eGaN FETs are Exposed to Voltage and Current Levels Well Above Data Sheet Limits

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Extreme GaN – What Happens When eGaN FETs are Exposed to Voltage and Current Levels Well Above Data Sheet Limits

Recently, Efficient Power Conversion (EPC) did a series of tests to take eGaN® FETs beyond their data sheet limits to quantify the effects of large amounts of overstress voltage and current and the results are published here for the first time.

Bodo’s Power Systems
May, 2021
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