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Efficient Power Conversion (EPC) Publishes Tenth Reliability Report Highlighting Gallium Nitride Device Testing Beyond Automotive AEC-Q101 Qualification

Efficient Power Conversion (EPC) Publishes Tenth Reliability Report Highlighting Gallium Nitride Device Testing Beyond Automotive AEC-Q101 Qualification
EPC’s Phase Ten Reliability Report adds to the growing knowledge base published in the first nine reports. With this report, EPC has stress-tested over 30,000 parts for a total of over 18 million hours without failure.  There have been no field failures in over two years despite shipping millions of parts. EL SEGUNDO, Calif.— February 2019 — EPC announces its Phase Ten Reliability Report, documenting the test results leading to the successful completion of automotive AEC-Q101 qualification. AEC-Q101 demands the highest level of reliability standards for ... Read more
Categories: Press Releases

eGaN Technology Reliability and Physics of Failure - Gate Voltage Stress Reliability

eGaN Technology Reliability and Physics of Failure - Gate Voltage Stress Reliability
The previous installment in this series focused on the physics of failure surrounding thermo-mechanical reliability of EPC eGaN wafer level chip-scale packages. A fundamental understanding of the potential failure modes under voltage bias is also important. This installment will provide an overview of the physics of failure associated with voltage bias at the gate electrode of gallium nitride (GaN) field effect transistors (FETs). Here we look at the case of taking the gate control voltage to the specified limit and beyond to investigate how eGaN FETs behave over a projected ... Read more
Categories: Articles

eGaN Technology Reliability and Physics of Failure - Strain on solder joints

eGaN Technology Reliability and Physics of Failure - Strain on solder joints
The first three installments in this series covered field reliability experience and stress test qualification of EPC’s enhancement-mode gallium nitride (eGaN) field effect transistors (FETs) and integrated circuits (ICs). Excellent field reliability that was documented is the result of applying stress tests covering the intended operating conditions the devices will experience within applications. Of equal importance is understanding the underlying physics of how eGaN devices will fail when stressed beyond intended operating conditions (e.g. datasheet parameters and safe operating area). ... Read more
Categories: Articles

eGaN Technology Reliability and Physics of Failure Blog #3

eGaN Technology Reliability and Physics of Failure Blog #3
The first two installments in this series reported in detail on field reliability experience of Efficient Power Conversion (EPC) Corporation’s enhancement-mode gallium nitride (eGaN®) FETs and integrated circuits (ICs). The excellent field reliability of eGaN devices demonstrates stress-based qualification testing is capable of ensuring reliability in customer applications. In this installment we will examine the stress tests that EPC devices are subjected to prior to being considered qualified products. Planet Analog Chris Jakubiec July 9, 2016 Read article Read more
Categories: Articles

eGaN Technology Reliability and Physics of Failure - Examining eGaN Field Reliability

eGaN Technology Reliability and Physics of Failure - Examining eGaN Field Reliability
Efficient Power Conversion (EPC) Corporation’s enhancement-mode gallium nitride (eGaN®) FETs and integrated circuits (ICs) are finding their way into many end user applications such as LIDAR, wireless charging, DC-DC conversion, RF base station transmission, satellite systems, and audio amplifiers. Field reliability is the ultimate metric that corroborates the quality level of eGaN® FETs and ICs that have been deployed in customer applications. In our first installment we provided an overview of eGaN FET field reliability which included 6 years of volume production ... Read more
Categories: Articles
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