Design Tools for Process and Reliability Testing

EPC provides a range of devices for daisy chain and electromigration testing. A variety of die sizes are currently available. If there is a die size required for your testing that is not currently represented in the table below, please contact us at

Electromigration test devices have internal metal layers shorted for electromigration reliability testing.

Daisy chain test devices are suitable for a wide variety of process-related testing, such as life cycle testing, drop testing, thermal testing, and optimizing the assembly process.

Design Tool Dies

Device Availability Table

Test Function 封装
EPCDESIGNTOOL_MD-EM Electromigration 2.1 x 1.6
EPCDESIGNTOOL_LG-EM Electromigration 4.1 x 1.6
EPCDESIGNTOOL_RP-DC Daisy Chain 4.6 x 2.6
EPCDESIGNTOOL_XL-EM Electromigration 6.1 x 2.3
EPCDESIGNTOOL_XL-DC Daisy Chain 6.1 x 2.3