新闻

客户可以在我们的网页 注册 ,定期收取最新消息包括全新产品发布、应用文章及更多其它资讯。如果你错过了已发布的资料,你可浏览以下的文档。

eGaN™-Silicon Power Shoot-Out: Part 1 Comparing Figure of Merit (FOM)

One yardstick to compare enhancement mode GaN (eGaN) power devices with state-of-the-art silicon MOSFETs is FOM. However, beyond these pure mathematical numbers, there are other device and package related parameters that significantly influence in-circuit performance.

By Johan Strydom PHD, Director of Application Engineering, EPC
Power Electronics Technology
September 1, 2010

Read the article

阅读全文