How to GaN Webinar Series

How2GaN夏季研讨会

了解死区时间、QRR和COSS的影响

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How2GaN夏季研讨会系列的第三个主题是了解死区时间、QRR和COSS的影响。涵盖的内容包括:

  • 死区时间损耗如何影响开关损耗
  • 体二极管压降和反向恢复
  • COSS 的作用
  • 考虑这些损耗的设计技巧

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Mark Gurries

Speaker: Mark Gurries is a FAE providing EPC technical support to the western half of the USA. Mark works directly with customers providing all forms of technical support from education to doing designs for large customers to help them realize the full benefits of GaN FETs over silicon based solutions in multiple different type of applications.

Prior to joining EPC in 2016, Mark was a senior design engineer with 31 years of experience in product design and IC’s in the DC-DC market. Notable companies that Mark has worked for are Apple designing notebook power supplies and Linear Technology defining IC functions and specifications while designing IC demoboards and datasheet application notes. Since then Mark has moved on to smaller startup companies. Mark started his career in 1985 working for a couple of mil spec product manufactures designing and/or manufacturing power supplies. Mark has 5 patents and written over 11 technical articles in multiple electronic publications.

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了解死区时间、QRR和COSS的影响

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