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Accurate Characterization of Low-Voltage, Small-Form–Factor GaN FETs
Lower-voltage GaN FETs are reducing size, minimizing cooling requirements and improving efficiency.
Lower-voltage GaN FETs (i.e., 100 V) are reducing size, minimizing cooling requirements and improving efficiency for many traditional Si-based power MOSFET applications. In this article, the challenges to repeatably and reliable characterization of the dynamic performance of these devices is discussed. Careful and thoughtful mechanical and electrical design of a customized GaN fixture and test board can overcome many of these challenges, enabling the confident use of these new WBG devices in your power-converter designs.
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