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Gallium nitride power device technology enables a new generation of power converters in space operating at higher frequencies, higher efficiencies, and greater power densities than everachievable before. GaN power devices can also exhibit superior radiation tolerance compared with Silicon MOSFETs depending upon their device design.
Power Electronics Europe
氮化鎵功率電晶體是面向嚴苛航太任務的功率和射頻應用的理想元件。 通過全新基於eGaN®元件的解決方案，EPC Space公司提供專門為商業衛星關鍵應用而設計的氮化鎵元件，可確保元件的耐輻射性能和對單粒子效應的免疫能力。 這些元件具有極高的電子遷移率、低溫度系數和非常低的導通阻抗。
宜普電源轉換公司（EPC）與VPT公司（海科航空公司旗下公司、NYSE交易代號為HEI.A及HEI）宣佈成立合資公司EPC Space LLC，針對衛星及高可靠性應用，從事設計和製造抗輻射、採用封裝、通過測試和經認證合格的矽基氮化鎵電晶體和積體電路。
Two space travel related stories hit my desktop this week; one that rapidly generated major international headlines and one that slid very quietly onto my email screen.
The headline-hitter was the successful launch of Elon Musk’s SpaceX rocket with its payload of a Tesla sports car, complete with a dummy driver at the wheel. The second was about Gallium Nitride technology that would be suitable for space applications.
SL70040SEH Low Side GaN FET Driver Powers ISL7002xSEH GaN FETs in Launch Vehicle and Satellite Power Supplies
TOKYO--(BUSINESS WIRE)--Renesas Electronics Corporation (TSE:6723), a premier supplier of advanced semiconductor solutions, today announced the space industry’s first radiation-hardened, low side Gallium Nitride (GaN) field effect transistor (FET) driver and GaN FETs that enable primary and secondary DC/DC converter power supplies in launch vehicles and satellites, as well as downhole drilling and high reliability industrial applications. These devices power ferrite switch drivers, motor control driver circuits, heater control modules, embedded command modules, 100V and 28V power conditioning, and redundancy switching systems.
Microsemi is working with Efficient Power Conversion (EPC) www.epc-co.com in the development of a complete line of high performance FETS for high reliability space and military applications. A jointly researched paper entitled "Enhancement Mode Gallium Nitride Characteristics Under Long Term Stress" will be presented at the Government Microcircuit Applications and Critical Technology Conference (GOMAC), March 21-24, 2011 in Orlando, Florida. The study covers the reliability testing results and demonstrates the stability of the devices at temperature and under radiation exposure.
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