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Podcast - Spirit Behind the Screen: EPC's Alex Lidow and GaN Reliability

Podcast - Spirit Behind the Screen: EPC's Alex Lidow and GaN Reliability

In this episode, Alex Lidow and Marti McCurdy discusses EPC’s test-to-failure method in improving gallium nitride (GaN) devices. According to Alex, testing to failure has allowed EPC to tease out the exact stressors that cause failure and improve EPC’s GaN devices 10-100 times the reliability of commercial devices, and even 100 times reliability in space applications.

Alex and Marti discuss:

(1:30) Why test to fail
(4:14) Learning from failure data and stressors
(11:38) Safe Operating Area
(14:30) Mechanical stressors
(17:45) EPC Space

Listen now

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EPC及Spirit Electronics提供eGaN功率元件的資料包

EPC及Spirit Electronics提供eGaN功率元件的資料包

EPC及Spirit Electronics公司攜手為客戶提供領導業界的氮化鎵功率元件的特定製造批次的資料服務。

宜普電源轉換公司(EPC)宣佈與Spirit Electronics公司攜手為客戶提供一系列氮化鎵功率元件的特定批次的數據。

宜普公司首席執行長及共同創辦人Alex Lidow說:「Spirit Electronics具備與國防及宇航客戶的豐富合作經驗,我們攜手為嚴峻應用環境所需,為客戶增值而提供氮化鎵(eGaN)功率半導體的特定批次的資料包。」

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