GaN Device Test Information

EPC has partnered with Spirit Electronics to provide an expanded range of manufacturing lot specific data services. The below table details the services available. If you have specific requirements not addressed in the table below, please contact us at [email protected]

Data Pack Offering for EPC Commercial Devices

Data Pack
Description
Test Parameter
Data Type
Temperature
Lot Data Pack Lot on tape and reel. Data pack of electrical distribution for the lot.
(mean, standard deviation, min, max)		 IDSS (Drain-Source Leakage) mean,
std dev,
min, max		 25°C
IGSS5V (Gate-to-Source Forward Leakage)
IGSSmV (Gate-to-Source Reverse Leakage) - when applicable
VGS(TH) (Gate Threshold Voltage)
RDS(ON) Drain-Source On Resistance
Serialized Lot Data Pack Die in tape and reel with individual identification.
Serialized data pack of electrical test data for each die, 25°C data		 IDSS (Drain-Source Leakage) Serialized Read & Record 25°C
IGSS5V (Gate-to-Source Forward Leakage)
IGSSmV (Gate-to-Source Reverse Leakage) - when applicable
VGS(TH) (Gate Threshold Voltage)
RDS(ON) Drain-Source On Resistance
Serialized Lot Data Pack - HighTemp Die in tape and reel with individual identification.
Serialized data pack of electrical test data for each die, sample probe at 150°C, data pack at 90°C		 IDSS (Drain-Source Leakage) Serialized Read & Record 150°C
IGSS5V (Gate-to-Source Forward Leakage)
IGSSmV (Gate-to-Source Reverse Leakage) - when applicable
VGS(TH) (Gate Threshold Voltage)
RDS(ON) Drain-Source On Resistance
Serialized Lot Data Pack - LowTemp Die in tape and reel with individual identification.
Serialized data pack of electrical test data for each die, -55°C data		 IDSS (Drain-Source Leakage) Serialized Read & Record -55°C
IGSS5V (Gate-to-Source Forward Leakage)
IGSSmV (Gate-to-Source Reverse Leakage) - when applicable
VGS(TH) (Gate Threshold Voltage)
RDS(ON) Drain-Source On Resistance
Serialized Lot Data Pack With Visual Die in tape and reel with individual identification.
Serialized data pack of electrical test data for each die, 25°C data.
Die Visual inspection sample data 		IDSS (Drain-Source Leakage) Serialized Read & Record 25°C
IGSS5V (Gate-to-Source Forward Leakage)
IGSSmV (Gate-to-Source Reverse Leakage) - when applicable
VGS(TH) (Gate Threshold Voltage)
RDS(ON) Drain-Source On Resistance
Visual Inspection Sample Data Serialized photo records N/A
Serialized Lot Data Pack With Visual - HighTemp Die in tape and reel with individual identification.
Serialized data pack of electrical test data for each die, sample probe at 150°C, data pack at 90°C
Die Visual inspection sample data 		IDSS (Drain-Source Leakage) Serialized Read & Record 150°C
IGSS5V (Gate-to-Source Forward Leakage)
IGSSmV (Gate-to-Source Reverse Leakage) - when applicable
VGS(TH) (Gate Threshold Voltage)
RDS(ON) Drain-Source On Resistance
Visual Inspection Sample Data Serialized photo records N/A
Serialized Lot Data Pack With Visual - LowTemp Die in tape and reel with individual identification.
Serialized data pack of electrical test data for each die, -55°C data
Die Visual inspection sample data 		IDSS (Drain-Source Leakage) Serialized Read & Record -55°C
IGSS5V (Gate-to-Source Forward Leakage)
IGSSmV (Gate-to-Source Reverse Leakage) - when applicable
VGS(TH) (Gate Threshold Voltage)
RDS(ON) Drain-Source On Resistance
Visual Inspection Sample Data Serialized photo records N/A

Download data pack brochure