In this interview, EPC’s Maurizio Di Paolo Emilio speaks with AccoTEST Global Marketing Director Huipeng Liu about a decade of experience testing GaN and other wide bandgap devices. Liu explains why GaN must be treated as an IC, not a simple discrete, and describes AccoTEST’s multi-site, wafer-level test solutions. They discuss reliability challenges for AI data centers, key wafer-level parameters such as leakage and Rds(on), and why future breakthroughs in GaN will be driven primarily by applications.