EPC技术文章

Test-to-Fail Methodology for Accurate Reliability and Lifetime Evaluation of eGaN Devices in Solar Applications

2023年5月2日

Test-to-Fail Methodology for Accurate Reliability and Lifetime Evaluation of eGaN Devices in Solar Applications

Modern solar panels are demanding increasingly higher power density and longer operating lifetimes. Solar applications including power optimizers and panels with built-in microinverters are becoming the prevailing trend for an increasing number of solar customers, where low voltage GaN power devices (VDS < 200 V) are extensively used.

Bodo’s Power Systems
May, 2023
Read article