Download free ebook:
Projecting eGaN® Device Lifetime
Download this ebook for insights into the strategy underlying eGaN devices’ remarkable field reliability record.
This ebook contains five key takeaways leading to a better understanding of the conditions leading to failure in eGaN devices and uses the information to create models to predict reliability.
These five key takeaways are:
- Gate stress test to fail and projecting the lifetime of eGaN devices
- Drain stress test to fail and projecting the lifetime of eGaN devices while virtually eliminating dynamic RDS(on)
- Lidar pulse stress test to assess long-term reliability
- Thermo-mechanical stress and the selection of underfill for ultra-long-term device operation under severe temperature excursions
- eGaN device field reliability over 226 billion hours of operation