Using Test-to-Fail Methodology to Accurately Predict Projected Lifetime of GaN FETs and ICs in Motor Drive Applications
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By leveraging the benefits of GaN FETs and ICs, motor drive applications can achieve higher efficiency, improved performance, and compact designs. The use of GaN technology in motor drive systems contributes to energy savings, reduced heat dissipation, and enhanced overall system reliability.
During this webinar, we will examine how the Test-to-Fail methodology enables projection of the lifetime of GaN FETs and ICs in motor drive applications for various industries including eMobility, robotics, industrial automation, and drones.
Join the webinar to learn more about:
- Introduction to GaN technology and its advantages in motor drive applications.
- In-depth exploration of the Test-to-Fail methodology and its applicability in accurately forecasting the projected lifetime of GaN FETs and ICs for motor drives.
- Real-world results showcasing the exceptional reliability of GaN devices in motor drive applications.
- Question and answer session to address your specific queries and concerns.
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