How to GaN Webinar Series

Reliability Webinar

Understanding Why GaN is More Robust than Silicon Power MOSFETs (Conducted in Japanese)

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Watch the on-demand webinar to discover the critical aspects of GaN power device reliability and how testing gallium nitride devices to failure demonstrates robustness unmatched by silicon power MOSFETs.

Join the webinar to learn more about:

  • How the key mechanisms impacting dynamic RDS(on) have been identified and used to create more robust designs.
  • How several eGaN® products were tested exhaustively throughout their data sheet safe operating area (SOA), and then taken to failure to probe the safety margins.
  • How eGaN devices are tested to destruction under short-circuit conditions to determine how long and what energy density they withstand before catastrophic failure.
  • How EPC developed a custom system to assess eGaN reliability over long-term lidar pulse stress conditions.

Click here to see full webinar schedule

Shoichi Yasuda joined EPC as the Vice President of Sales for Japan and Korea in October 2018 with over 20 years of work experience. His primary responsibilities at EPC are creating and implementing strategies to achieve the company’s sales objectives in Japan and Korea. Yasuda worked for a wide range of semiconductor companies holding positions as FAE, as well as Sales/Marketing management. Before joining EPC, he worked for a large stocking representative in Japan, where he acquired in-depth knowledge of EPC’s eGaN products and advantages. In representing EPC, Yasuda captured opportunities to demonstrate EPC’s solutions at various customers all over Japan, sharing with design engineers the latest technological development of gallium nitride devices and applications.

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