Projecting eGaN Device Lifetime eBook

Download free ebook:
Projecting eGaN® Device Lifetime

Projecting eGaN Device Lifetime

Download this ebook for insights into the strategy underlying eGaN devices’ remarkable field reliability record.

This ebook contains five key takeaways leading to a better understanding of the conditions leading to failure in eGaN devices and uses the information to create models to predict reliability.

These five key takeaways are:

  1. Gate stress test to fail and projecting the lifetime of eGaN devices
  2. Drain stress test to fail and projecting the lifetime of eGaN devices while virtually eliminating dynamic RDS(on)
  3. Lidar pulse stress test to assess long-term reliability
  4. Thermo-mechanical stress and the selection of underfill for ultra-long-term device operation under severe temperature excursions
  5. eGaN device field reliability over 226 billion hours of operation

EPC has the largest GaN portfolio in the industry from 15 V – 350 V, from less than 1 A to 590 A.
See EPC's product portfolio.

Download the free
ebook today!

By submitting this request, I agree with EPC Terms of Use and Privacy Policy

* Denotes required field

Enter Captcha Value:*
captcha