GAL03 GaN is Reliable

Thirty years of silicon power MOSFET development taught us that one of the key variables controlling the adoption rate of a disruptive technology is whether or not the product is reliable enough to use in the application. This principle has guided the design of EPC's enhancement mode Gallium Nitride devices. EPC has performed reliability testing demonstrating that the technology is ready for commercial use. This video describes the reliability tests performed and the results achieved.


Next module in GaN Advanced Learning Series - GAL04 500 W DC-DC with GaN – The Power of a Quarter Brick in the Size of an Eight Brick