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Test-to-Fail Methodology for Accurate Reliability and Lifetime Evaluation of eGaN Devices in Solar Applications
Modern solar panels are demanding increasingly higher power density and longer operating lifetimes. Solar applications including power optimizers and panels with built-in microinverters are becoming the prevailing trend for an increasing number of solar customers, where low voltage GaN power devices (VDS < 200 V) are extensively used.
Bodo’s Power Systems