The rapid adoption of GaN devices in many diverse applications calls for continued accumulation of reliability statistics and research into
the fundamental physics of failure in GaN devices. This eBook presents the strategy used to measure and predict lifetime based upon tests
that force devices to fail under a variety of conditions. This information can be used to create stronger and higher performance products
for the industry.
Alejandro Pozo Ph.D., Shengke Zhang Ph.D., Gordon Stecklein Ph.D., Ricardo Garcia, John Glaser Ph.D., Zhikai Tang Ph.D., and Robert Strittmatter Ph.D., Efficient Power Conversion