EPC Technical Articles

Improving Reliability For GaN And SiC

Tuesday, June 23, 2020

Improving Reliability For GaN And SiC

Why these chips are gaining ground, and what still needs to be addressed. Suppliers of gallium nitride (GaN) and silicon carbide (SiC) power devices are rolling out the next wave of products with some new and impressive specs. But before these devices are incorporated in systems, they must prove to be reliable.

Semiconductor Engineering
June, 2020
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