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EPC Releases Phase 17 Reliability Report: Advancing GaN Reliability and Lifetime Projections

EPC Releases Phase 17 Reliability Report: Advancing GaN Reliability and Lifetime Projections

EL SEGUNDO, Calif. — February 2025 — EPC, the leader in gallium nitride (GaN) power devices, announces the release of its Phase 17 Reliability Report, further solidifying GaN’s position as a highly reliable technology for power electronics, automotive, AI, space, and industrial applications.

The latest reliability report introduces expanded lifetime models, mission-specific reliability projections, and new physics-based wear-out mechanisms, providing engineers with more accurate and practical reliability data for GaN power devices.

Key Highlights of the Phase 17 Reliability Report

  • Expanded Gate Lifetime Model: Incorporates gate leakage current effects across voltages and temperatures, leading to enhanced impact ionization modeling
  • Repetitive Transient Gate Overvoltage Testing: Develops and validates a 7 V gate overvoltage rating, addressing resonance-like transient stress in real-world applications
  • Enhanced Drain Overvoltage Robustness: Further validation of GaN’s superior durability under repetitive transient drain-source overvoltage conditions
  • New Pulsed Current Rating Data: Extends testing to over 100 million pulses, proving minimal parametric shifts in Gen-5 and Gen-6 GaN devices
  • Comprehensive Thermomechanical Lifetime Model: Now includes power cycling (PC) modeling, essential for high-stress applications like automotive and AI power systems
  • Mission-Specific Reliability Insights: Expanded analysis for solar, lidar, and DC-DC conversion applications, allowing engineers to fine-tune their designs for long-term operation

Driving GaN Forward in Reliability & Performance

EPC’s test-to-fail methodology continues to push GaN technology beyond traditional silicon MOSFETs. By integrating real-world stress conditions into advanced lifetime models, the Phase 17 report ensures more accurate reliability projections for next-generation power applications.

This report advances GaN reliability modeling with mission-specific projections and new lifetime models, enabling engineers to integrate GaN into high-power, efficient, and robust designs with confidence, said Alex Lidow, EPC CEO and co-founder.

Availability

The EPC Phase 17 Reliability Report is available for download at epc-co.com. For additional technical details, Ask a GaN Expert.

About EPC

EPC is the leader in enhancement mode gallium nitride (eGaN®) based power management. eGaN FETs and integrated circuits provide performance many times greater than the best silicon power MOSFETs in applications such as DC-DC converters, remote sensing technology (lidar), motor drives for eMobility, robotics, and drones, and low-cost satellites.

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Press contact

Efficient Power Conversion:
Renee Yawger
Tel: +1.908.619.9678
Email: [email protected]