Design Tools for Process and Reliability Testing

EPC provides a range of devices for daisy chain and electromigration testing. A variety of die sizes are currently available. If there is a die size required for your testing that is not currently represented in the table below, please contact us at [email protected]

Electromigration test devices have internal metal layers shorted for electromigration reliability testing.

Daisy chain test devices are suitable for a wide variety of process-related testing, such as life cycle testing, drop testing, thermal testing, and optimizing the assembly process.

Design Tool Dies

Device Availability Table

Test Function Package
EPCDESIGNTOOL_MD-EM Electromigration 2.1 x 1.6 Buy Now
EPCDESIGNTOOL_LG-EM Electromigration 4.1 x 1.6 Buy Now
EPCDESIGNTOOL_RP-DC Daisy Chain 4.6 x 2.6 Buy Now
EPCDESIGNTOOL_XL-EM Electromigration 6.1 x 2.3 Buy Now
EPCDESIGNTOOL_XL-DC Daisy Chain 6.1 x 2.3 Buy Now